Material Characterization Training

Week 1 : 1. Fundamentals of optics2. Optical microscope and its instrumental details

Week 2 : 3. Variants in the optical microscopes and image formation 4. Phase contrast, Polarised light, Differential interference contrast, Fluorescence microscopy

Week 3 : 5. Sample preparation and applications of optical microscopes 

Week 4 : 6. Introduction to Scanning electron microscopy (SEM)

Week 5 : 7. Instrumental details and image formation of SEM 

Week 6 : 8. Various imaging techniques and spectroscopy9. Sample preparation and applications of SEM

Week 7 : 10. Fundamentals of X-ray scattering 11. Bragg’s law derivation and the factors affecting the intensity

Week 8 : 12. Crystallite size, effect of strain on the intensity 13. Profile fit, indexing, peak broadening

Week 9 : 14. Quantitative analysis, residual stress analysis 15. Instrumentation details and demo experiments of XRDWeek 10 :16. Introduction to transmission electron microscopy (TEM) 

Week 11 :17. Diffraction and image formation18. Various imaging techniques and spectroscopy

Week 12 :19. Sample preparation and applications of TEM 20. Instrumentation details and demo experiments of TEM